| 摘要 |
<p>Occurrence of a spark is suppressed, and burnout or removal of a probe is prevented in a probe of the present invention. The probe of the present invention is a probe provided with a linear main body portion having a tip in contact with an electrode of a member to be tested in a state where a board-side end is in contact with the circuit board side of a probe card and an elastic support portion which is provided on a board-side end portion of the main body portion and elastically supports the main body portion on the probe card side. The elastic support portion has its base end side integrally fixed to the board-side end portion of the main body portion and is formed with the distal end side directed toward the tip portion of the main body portion and curved having an arc shape toward the main body portion side. Moreover, two pieces of the elastic support portion are provided symmetrically on the both sides sandwiching the main body portion on the board-side end portion of the main body portion and they are configured by being curved, each having an arc shape with the same radius of curvature. The above-described probe is used as a probe to be provided in plural in the probe card.</p> |
