| 摘要 |
PROBLEM TO BE SOLVED: To quickly perform appropriate shape defect inspections by speedily executing processing for reliably removing measurement values of formation ranges of embossed marks without any mistakes according to distribution information of surface height measurement values of sidewall surfaces of tires. SOLUTION: A processor automatically detects the positions of the embossed marks based on sample surface shape information obtained from samples of tires, and automatically sets coordinates information for a mask range surrounding the area where the marks are present (S2-S15). The processor also superposes a surface shape image based on the sample surface shape information and a mask range image based on the coordinates information for the mask range for displaying on a display means, and changes the coordinates information for the mask range according to operation input side by side with the display (S16). The processor also corrects deviation in the coordinates system between the surface height distribution information obtained from the tires to be inspected and the coordinates information for the mask range after the change and excludes measurement values in the mask range from targets of shape defect inspection processing. COPYRIGHT: (C)2010,JPO&INPIT
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