发明名称 Plasma processing apparatus and plasma processing method
摘要 A plasma processing apparatus for processing a substrate using plasma includes a first electrode configured to mount the substrate, a second electrode disposed to face the first electrode with a predetermined space, a chamber containing the first electrode and the second electrode, the chamber being capable of adjusting an inside atmosphere, a first electric power source device configured to apply a first RF voltage for controlling a self-bias voltage generated on the substrate to the first electrode, the first electric power source device applying a substantially constant width and a substantially constant value in a peak-to-peak voltage of an RF voltage of a first frequency at intervals, and a second electric power source device configured to apply a second RF voltage of a second frequency for generating plasma between the first and second electrodes to one of the first electrode and the second electrode.
申请公布号 US8545670(B2) 申请公布日期 2013.10.01
申请号 US20080209617 申请日期 2008.09.12
申请人 KOJIMA AKIHIRO;HAYASHI HISATAKA;UI AKIO;KABUSHIKI KAISHA TOSHIBA 发明人 KOJIMA AKIHIRO;HAYASHI HISATAKA;UI AKIO
分类号 C23F1/00;C23C16/00;H01L21/306 主分类号 C23F1/00
代理机构 代理人
主权项
地址