发明名称 NONVOLATILE MEMORY DEVICE AND METHOD FABRICATING THE SAME
摘要 <p>PURPOSE: A nonvolatile memory device and a method for fabricating the same are provided to facilitate a charge injection process by forming a charge trapping layer made of a nanoadsorption material. CONSTITUTION: A tunnel oxide layer is formed on a semiconductor substrate. A charge trapping layer (130) has a first region and a second region. The charge trapping layer is made of a nanoadsorption material. A blocking oxide layer (140) is formed on the charge trapping layer. A gate electrode (150) is formed on the blocking oxide layer.</p>
申请公布号 KR20130107065(A) 申请公布日期 2013.10.01
申请号 KR20120028861 申请日期 2012.03.21
申请人 INTELLECTUAL DISCOVERY CO., LTD. 发明人 KIM, TAE GEUN;AN, HO MYOUNG;KIM, KYEONG HEON
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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