发明名称 Method of fabricating a self-aligned top-gate organic transistor
摘要 A method of fabricating a self-aligned top-gate organic transistor comprises depositing a photoresist material over the dielectric material, and exposing the photoresist material to irradiation through the substrate using the source and drain electrodes as a mask. The exposure defines a region for deposition of the gate electrode.
申请公布号 US8546179(B2) 申请公布日期 2013.10.01
申请号 US20090645101 申请日期 2009.12.22
申请人 SMITH EUAN;CAMBRIDGE DISPLAY TECHNOLOGY LTD. 发明人 SMITH EUAN
分类号 H01L51/40 主分类号 H01L51/40
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