发明名称 Temperature compensation circuit and temperature compensated metal oxide semiconductor transistor using the same
摘要 A temperature compensation circuit, applied on a metal oxide semiconductor (MOS) transistor, with a threshold voltage varying with respect to a temperature value of the MOS transistor, for having the MOS transistor corresponding to an equivalent threshold voltage substantially with a constant value throughout a temperature range, comprises a voltage generator. The voltage generator provides a voltage proportional to absolute temperature (VPTAT) to drive the body of the MOS transistor in such way that a variation of the threshold voltage due to temperature variation of the MOS transistor is substantially compensated with a variation of the threshold voltage due to body-source voltage variation of the MOS transistor, so that the MOS transistor corresponds to the equivalent threshold voltage that is temperature invariant.
申请公布号 US8547166(B2) 申请公布日期 2013.10.01
申请号 US201113194039 申请日期 2011.07.29
申请人 CHIANG JU-AN;CHANG HSING-WEN;MACRONIX INTERNATIONAL CO., LTD. 发明人 CHIANG JU-AN;CHANG HSING-WEN
分类号 G05F1/10 主分类号 G05F1/10
代理机构 代理人
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