发明名称 Circuit board and method for testing component built in the circuit board
摘要 A circuit board includes an active device, a signal pad on a surface of the circuit board, at least one passive device electrically connecting the active device to the signal pad, and at least one test pad on the surface of the circuit board and electrically connected to a connection point between the active device and the at least one passive device. When a first passive device and a second passive device and a first test pad and a second test pad are provided, the first passive device and the second passive device are connected in series between the active device and the signal pad in this order, the first test pad is connected to a connection point between the active device and the first passive device, and the second test pad is connected to a connection point between the first passive device and the second passive device.
申请公布号 US8547132(B2) 申请公布日期 2013.10.01
申请号 US20100870347 申请日期 2010.08.27
申请人 KIM HYUN HO;JUNG WON GEUN;CHUNG YUL KYO;SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM HYUN HO;JUNG WON GEUN;CHUNG YUL KYO
分类号 G01R31/28 主分类号 G01R31/28
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