发明名称 |
Food quality examination device, food component examination device, foreign matter component examination device, taste examination device, and changed state examination device |
摘要 |
A food quality examination device using a high-sensitivity light-receiving element. The light-receiving element includes a III-V compound semiconductor stacked structure including an absorption layer having a pn-junction therein, wherein the absorption layer has a multiquanturn well structure composed of group III-V compound semiconductors, the pn-junction is formed by selectively diffusing an impurity element into the absorption layer, a diffusion concentration distribution control layer composed of III-V group semiconductor is disposed in contact with the absorption layer on a side of the absorption layer opposite the side adjacent to the group III-V compound semiconductor substrate, the bandgap energy of the diffusion concentration distribution control layer is smaller than that of the group III-V semiconductor substrate, the concentration of the impurity element selectively diffused in the diffusion concentration distribution control layer is decreased to be 5×1016/cm3 or less toward the absorption layer.
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申请公布号 |
US8546758(B2) |
申请公布日期 |
2013.10.01 |
申请号 |
US200913119619 |
申请日期 |
2009.07.24 |
申请人 |
NAGAI YOUICHI;IGUCHI YASUHIRO;SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
NAGAI YOUICHI;IGUCHI YASUHIRO |
分类号 |
G01J5/20;H01L29/861 |
主分类号 |
G01J5/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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