发明名称 Power supply apparatus for test apparatus
摘要 A power supply apparatus is provided for a test apparatus configured to supply a power supply signal to a DUT. An A/D converter performs analog/digital conversion of an analog observed value that corresponds to a power supply signal so as to generate a digital observed value. A digital signal processing circuit generates, by means of digital processing, a control value adjusted such that the digital observed value received from the A/D converter matches a predetermined reference value. A D/A converter performs digital/analog conversion of the control value, and supplies the resulting value to the DUT as the power supply signal. A digital signal processing circuit is configured to be capable of changing the content of its signal processing.
申请公布号 US8547265(B2) 申请公布日期 2013.10.01
申请号 US201113160309 申请日期 2011.06.14
申请人 SHIMIZU TAKAHIKO;DEGAWA KATSUHIKO;TANAKA HIRONORI;ADVANTEST CORPORATION 发明人 SHIMIZU TAKAHIKO;DEGAWA KATSUHIKO;TANAKA HIRONORI
分类号 H03M1/00 主分类号 H03M1/00
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