发明名称 ARC RESISTANCE PERFORMANCE EVALUATION DEVICE, ARC RESISTANCE PERFORMANCE EVALUATION SYSTEM, AND ARC RESISTANCE PERFORMANCE EVALUATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a device, system, or method capable of evaluating an arc resistance performance by irradiating a sample with a heat flux under the same condition with stability at low cost.SOLUTION: A device comprises: a high-frequency induction heat plasma generator 10; a first cylindrical part 20 connected to a second cylindrical part 13 and having a window 25 on at least one lateral face; and a specimen installation base 23 configured to be fixed and attached at a reference position in the first cylindrical part 20. The specimen installation base 23 has a pedestal part for installing a specimen 40, and a pressing part fixing the installed specimen 40 in a state that the specimen 40 is partially exposed. The device is configured to enable observation of ablation vapor generated from the specimen, from the outside of the first cylindrical part via the window, in a state that the specimen installed to the specimen installation base is irradiated with plasma generated at the high-frequency induction heat plasma generator.
申请公布号 JP2013196853(A) 申请公布日期 2013.09.30
申请号 JP20120060734 申请日期 2012.03.16
申请人 KANEKA CORP 发明人 TANAKA YASUNORI;ISHIDA MASAHIRO;SHINSEI NAOKI;HANEKI HIROYASU;MIZOBUCHI ATSUSHI
分类号 H05H1/30;G01N5/00;G01N21/73 主分类号 H05H1/30
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