发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device capable of correctly setting a desired test mode even when there is an error in an analog input signal for setting the test mode.SOLUTION: A microcomputer 10 that is a semiconductor integrated circuit device according to an embodiment includes a terminal T2 to which an analog signal TAIN for setting a test mode is input. A plurality of test modes are set according to the difference in a rise time of the analog signal TAIN.
申请公布号 JP2013195120(A) 申请公布日期 2013.09.30
申请号 JP20120060074 申请日期 2012.03.16
申请人 TOSHIBA CORP 发明人 OKUNO HIDEO;YOKOMIZO ATSUSHI
分类号 G01R31/28;G01R31/3185;H03M1/12 主分类号 G01R31/28
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