发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device capable of correctly setting a desired test mode even when there is an error in an analog input signal for setting the test mode.SOLUTION: A microcomputer 10 that is a semiconductor integrated circuit device according to an embodiment includes a terminal T2 to which an analog signal TAIN for setting a test mode is input. A plurality of test modes are set according to the difference in a rise time of the analog signal TAIN. |
申请公布号 |
JP2013195120(A) |
申请公布日期 |
2013.09.30 |
申请号 |
JP20120060074 |
申请日期 |
2012.03.16 |
申请人 |
TOSHIBA CORP |
发明人 |
OKUNO HIDEO;YOKOMIZO ATSUSHI |
分类号 |
G01R31/28;G01R31/3185;H03M1/12 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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