| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection apparatus and an inspection method which are capable of precisely inspect a connector pin in lower costs.SOLUTION: An inspection apparatus includes an imaging unit that takes an image of a pin train of a connector from an extension direction of each pin of the pin train via a non-telecentric lens, and a determination unit that sets any pin as an inspected pin and compares the image of the inspected pin and the image of any other pin to determine whether the inspected pin is acceptable or not. The determination unit includes, as an object of the comparison, a corrected image of any pin whose position and a position of the inspected pin are symmetric about the center of the image taken by the imaging unit. |
