| 摘要 |
<p>Provided is a testing device for verifying the performance of an infrared sensor in an instance in which a measurement object is positioned at each angle across a wide range of angles. The infrared sensor testing device comprises a spot heat source (101), a sensor holder (107), and a signal output unit (109). The sensor holder comprises a rotating stage for holding the sensor in a reference point located at a distance from the spot heat source, the rotating stage tilting the sensor about the reference point in two mutually orthogonal planes that include a straight line linking the reference point and the spot heat source. The signal output unit is configured so that a sensor signal is outputted for every angle by which the sensor is tilted in the two orthogonal planes.</p> |
