| 摘要 |
<p>The invention relates to the method for measuring of geometrical shift in flat panel x-ray image sensors using a test device. A test device comprising at least two edge test devices is placed on the detector's operating surface, The test device is exposed to x-rays in order to get its x-ray image where ROIs having pixels coordinates corresponding to the edge of each test device are identified. The pixel coordinates are used to determine sensor geometrical shifts considering minimum value of an objective function. Technical result involves expansion of technical means of definite application and a possibility to measure sensor geometrical shift with sufficient accuracy</p> |
