发明名称 |
SEMICONDUCTOR WAFER, SEMICONDUCTOR SUBSTRATE, AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To more surely prevent breakage of a gate insulating film due to charge-up in a process of manufacturing an MOSFET.SOLUTION: A semiconductor wafer includes a first conductivity type semiconductor substrate having thereon a plurality of chip regions, each of which is configured to form a semiconductor integrated circuit thereon, and a scribe region as being region between the individual chip regions. A second conductivity type diffusion layer extending from the inside of the chip region to the inside of the scribe region across a dicing line serving as a boundary of the chip region and the scribe region is disposed on the semiconductor wafer. A target protection portion of the semiconductor integrated circuit is connected to the diffusion layer via a wiring layer in the chip region. The diffusion layer is connected to the semiconductor substrate in the scribe region. |
申请公布号 |
JP2013197562(A) |
申请公布日期 |
2013.09.30 |
申请号 |
JP20120066548 |
申请日期 |
2012.03.23 |
申请人 |
YAMAHA CORP |
发明人 |
ISHIKAWA NORIYASU |
分类号 |
H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/088 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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