发明名称 SEMICONDUCTOR WAFER, SEMICONDUCTOR SUBSTRATE, AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To more surely prevent breakage of a gate insulating film due to charge-up in a process of manufacturing an MOSFET.SOLUTION: A semiconductor wafer includes a first conductivity type semiconductor substrate having thereon a plurality of chip regions, each of which is configured to form a semiconductor integrated circuit thereon, and a scribe region as being region between the individual chip regions. A second conductivity type diffusion layer extending from the inside of the chip region to the inside of the scribe region across a dicing line serving as a boundary of the chip region and the scribe region is disposed on the semiconductor wafer. A target protection portion of the semiconductor integrated circuit is connected to the diffusion layer via a wiring layer in the chip region. The diffusion layer is connected to the semiconductor substrate in the scribe region.
申请公布号 JP2013197562(A) 申请公布日期 2013.09.30
申请号 JP20120066548 申请日期 2012.03.23
申请人 YAMAHA CORP 发明人 ISHIKAWA NORIYASU
分类号 H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/088 主分类号 H01L21/822
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