发明名称 MANUFACTURING APPARATUS AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing apparatus and a manufacturing method of a semiconductor device, which can prevent swinging of a material to be coated on a substrate at the time of a discharge start and a discharge end of the material.SOLUTION: A semiconductor device manufacturing apparatus according to an embodiment comprises a discharge part and a control part. The discharge part discharges a material to be coated on a substrate. The control part raises a supply pressure of the material to be supplied to the discharge part to a first pressure to cause the discharge part to start discharge of the material; lowers the supply pressure to a second pressure at which the material discharged from the discharge part does not swing and maintains the supply pressure; and subsequently raises the supply pressure to a third pressure to cause the discharge part to terminate discharge of the material.
申请公布号 JP2013197444(A) 申请公布日期 2013.09.30
申请号 JP20120064950 申请日期 2012.03.22
申请人 TOSHIBA CORP 发明人
分类号 H01L21/316;B05C11/10;G03F7/16;H01L21/027;H01L21/31 主分类号 H01L21/316
代理机构 代理人
主权项
地址