发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which reduces resistance of a body and increases an operation speed in a Dt-MOS transistor.SOLUTION: In a semiconductor device, element isolation is achieved in an active region 21A by an element isolation region 21I and an n-type well 21NW under a p-type well 21PW. By forming an insulation film region part (21IT)at a depth deeper than at least a lower limit of a source region or drain region 21D, at a depth, for example, so as to reach the n-type well 21NW under the p-type well 21PW, the source region and the drain region 21Dare electrically isolated from a tap region 21T.
申请公布号 JP2013197314(A) 申请公布日期 2013.09.30
申请号 JP20120062885 申请日期 2012.03.19
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 HANEDA MASAKI
分类号 H01L21/336;H01L21/76;H01L21/762;H01L21/8234;H01L27/08;H01L27/088;H01L29/78;H01L29/786 主分类号 H01L21/336
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