| 摘要 |
The method involves calculating a total number of layers (106, 110) of a stack, thicknesses of each of the layers of the stack and values of complex refraction indices based on characteristics of a desired spectral reflectivity window of an optical reflector (100) by using an optical transfer matrices calculation method. Deposition and annealing parameters of one of the layers and a third layer are calculated based on the total number of layers, thicknesses and the values. The layer and the third layer of the stack are deposited and annealed in accordance with the parameters. An independent claim is also included for a method for manufacturing a photovoltaic cell. |
