发明名称 METHOD OF FABRICATING GATE INSULATING LAYER AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for forming a gate insulation layer and a method for manufacturing a semiconductor device are provided to generate a uniform threshold voltage by forming a rich germanium region on the surface of a channel region. CONSTITUTION: Germanium is implanted into a single crystal silicon-containing substrate (21). A device isolation region (22) is formed on the single crystal silicon-containing substrate. Gate oxide is formed on the surface of the single crystal silicon-containing substrate. A rich germanium region is formed under the gate oxide. The germanium oxide is crystallized by an annealing process.</p>
申请公布号 KR20130106164(A) 申请公布日期 2013.09.27
申请号 KR20120027843 申请日期 2012.03.19
申请人 SK HYNIX INC. 发明人 LEE, SEUNG MI;JI, YUN HYUCK;KIM, BEOM YONG;JEON, BONG SEOK
分类号 H01L21/336;H01L21/265;H01L29/78 主分类号 H01L21/336
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