发明名称 |
METHOD OF FABRICATING GATE INSULATING LAYER AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A method for forming a gate insulation layer and a method for manufacturing a semiconductor device are provided to generate a uniform threshold voltage by forming a rich germanium region on the surface of a channel region. CONSTITUTION: Germanium is implanted into a single crystal silicon-containing substrate (21). A device isolation region (22) is formed on the single crystal silicon-containing substrate. Gate oxide is formed on the surface of the single crystal silicon-containing substrate. A rich germanium region is formed under the gate oxide. The germanium oxide is crystallized by an annealing process.</p> |
申请公布号 |
KR20130106164(A) |
申请公布日期 |
2013.09.27 |
申请号 |
KR20120027843 |
申请日期 |
2012.03.19 |
申请人 |
SK HYNIX INC. |
发明人 |
LEE, SEUNG MI;JI, YUN HYUCK;KIM, BEOM YONG;JEON, BONG SEOK |
分类号 |
H01L21/336;H01L21/265;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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