发明名称 SEMICONDUCTOR MANUFACTURING DEVICE AND METHOD FOR DIAGNOSING SEMICONDUCTOR MANUFACTURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing device for reducing dust in a reaction tube.SOLUTION: The semiconductor manufacturing device of an embodiment includes: a reaction tube; a gas supply pipe connected to the reaction tube to supply gas into the reaction tube; and a nozzle provided at an end part of the gas supply pipe on a reaction tube side and formed with foamed quartz. It further includes a mass flow controller connected to the gas supply pipe to control a flow rate of the gas, and a first pressure gauge connected to the gas supply pipe between the mass flow controller and the nozzle.
申请公布号 JP2013191679(A) 申请公布日期 2013.09.26
申请号 JP20120055953 申请日期 2012.03.13
申请人 TOSHIBA CORP 发明人 NAKAO TAKASHI
分类号 H01L21/205;C23C16/44;H01L21/31 主分类号 H01L21/205
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