发明名称 |
SUBSTRATE WITH MULTILAYER REFLECTIVE FILM, REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY, METHOD FOR PRODUCING REFLECTIVE MASK FOR EUV LITHOGRAPHY, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
The purpose of the present invention is to provide: a substrate with a multilayer reflective film, which is used for the production of a reflective mask blank for EUV lithography wherein dry etching using a Cl-based gas is carried out, and which is extremely reduced in the loss of a protective film due to the above-mentioned dry etching and wet cleaning after the dry etching; and the like. The present invention is a substrate with a multilayer reflective film, which is used for the production of a reflective mask blank for EUV lithography, and which is characterized in that: the substrate with a multilayer reflective film comprises a substrate, a multilayer reflective film that is formed on the substrate and reflects EUV light, and a protective film that is formed on the multilayer reflective film and protects the multilayer reflective film; the protective film is formed of an alloy that contains at least two kinds of metals; and the alloy is a complete solid solution. |
申请公布号 |
WO2013141268(A1) |
申请公布日期 |
2013.09.26 |
申请号 |
WO2013JP57957 |
申请日期 |
2013.03.21 |
申请人 |
HOYA CORPORATION |
发明人 |
ONOUE, TAKAHIRO;ORIHARA, TOSHIHIKO |
分类号 |
H01L21/027;G03F1/24;G03F1/48 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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