发明名称 Same-Chip Multicharacteristic Semiconductor Structures
摘要 In one exemplary embodiment, a semiconductor structure includes: a semiconductor-on-insulator substrate with a top semiconductor layer overlying an insulation layer and the insulation layer overlies a bottom substrate layer; at least one first device at least partially overlying and disposed upon a first portion of the top semiconductor layer, where the first portion has a first thickness, a first width and a first depth; and at least one second device at least partially overlying and disposed upon a second portion of the top semiconductor layer, where the second portion has a second thickness, a second width and a second depth, where at least one of the following holds: the first thickness is greater than the second thickness, the first width is greater than the second width and the first depth is greater than the second depth.
申请公布号 US2013249004(A1) 申请公布日期 2013.09.26
申请号 US201313895785 申请日期 2013.05.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DORIS BRUCE B.;CHENG KANGGUO;KHAKIFIROOZ ALI;KULKARNI PRANITA;SHAHIDI GHAVAM G.
分类号 H01L27/12 主分类号 H01L27/12
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