发明名称 Method for calibration, testing, analysis and feedback of reference parameter, involves observing or imaging two patterns during actual expansion and deformation of object, where patterns represent one of deformation or expansion conditions
摘要 <p>The method involves observing or imaging two speckle patterns, grid patterns, or other patterns during an actual expansion and deformation of an object, where the patterns represent one of the deformation or expansion conditions. The conditions are derived from a theory of artificially produced expansion field or deformation condition. The patterns are imaged, projected, carried or applied on the surface of a reference body at different areas, and are measured, particularly by the geometric optical reference measurement systems. An independent claim is included for a device for calibration, testing, analysis and for the feedback of reference parameters of the expansion and deformation measuring characteristics of an image correlation system.</p>
申请公布号 DE102012004546(A1) 申请公布日期 2013.09.26
申请号 DE20121004546 申请日期 2012.03.10
申请人 MAECKEL, PETER 发明人 MAECKEL, PETER
分类号 G01B11/16;G01B11/24 主分类号 G01B11/16
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