TEST DEVICE, TEST METHOD, AND PROGRAM

摘要

When static electricity is applied to a board-to-be-tested (10) in the form of electromagnetic wave or when test noise is applied to the ground of the board-to-be-tested (10), a test device (20_1) and a test device (20_2) test whether or not noise is conducted through a path from the OUT-terminal of an amplifier circuit (K1) to the ground of the board-to-be-tested (10) and whether or not noise is conducted through a path from the OUT-terminal of an amplifier circuit (K2) to the ground of the board-to-be-tested (10), respectively, along with the noise conduction frequency.