发明名称 SOI SWITCH ENHANCEMENT
摘要 The described FET switch topology greatly reduces the off state loading experienced by the gate biasing resistors in a stacked FET structure. The FET switch topology evenly distributes the voltage across the FET switch topology which reduces the voltage across the gate biasing resistors when the stacked FET structure is in an off state. Because the off state loading is reduced, there is a corresponding reduction of the current through bias resistors, which permits a reduction in the size of the bias resistors. This permits a substantial reduction in the area attributed to the bias resistors in an integrated solution.
申请公布号 US2013249619(A1) 申请公布日期 2013.09.26
申请号 US201313892992 申请日期 2013.05.13
申请人 RF MICRO DEVICES, INC. 发明人 GRANGER-JONES MARCUS
分类号 H03K17/04 主分类号 H03K17/04
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