发明名称 |
SEMICONDUCTOR ELEMENT, SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND CONNECTION MATERIAL |
摘要 |
<p>When Sn-Ag-based or Sn-Cu-based lead-free solder is used in the semiconductor element junction of a power semiconductor module, extending the lifespan has been difficult due to the formation of a gap at the soldered section due to the current being switched on or off. The connection material of the power semiconductor module is used to form a junction in a semiconductor element having a stacked Ni/Cu/Ni/Sn structure, whereby a finer metal compound is obtained to improve thermal shock resistance, as well as to minimize the formation of a gap inside the solder junction that accompanies the switching on and off of the current and to obtain enhanced reliability.</p> |
申请公布号 |
WO2013140936(A1) |
申请公布日期 |
2013.09.26 |
申请号 |
WO2013JP54434 |
申请日期 |
2013.02.22 |
申请人 |
HITACHI, LTD. |
发明人 |
IKEDA, OSAMU;TEROUCHI, TOSHIO |
分类号 |
H01L21/52 |
主分类号 |
H01L21/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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