发明名称 SEMICONDUCTOR ELEMENT, SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND CONNECTION MATERIAL
摘要 <p>When Sn-Ag-based or Sn-Cu-based lead-free solder is used in the semiconductor element junction of a power semiconductor module, extending the lifespan has been difficult due to the formation of a gap at the soldered section due to the current being switched on or off. The connection material of the power semiconductor module is used to form a junction in a semiconductor element having a stacked Ni/Cu/Ni/Sn structure, whereby a finer metal compound is obtained to improve thermal shock resistance, as well as to minimize the formation of a gap inside the solder junction that accompanies the switching on and off of the current and to obtain enhanced reliability.</p>
申请公布号 WO2013140936(A1) 申请公布日期 2013.09.26
申请号 WO2013JP54434 申请日期 2013.02.22
申请人 HITACHI, LTD. 发明人 IKEDA, OSAMU;TEROUCHI, TOSHIO
分类号 H01L21/52 主分类号 H01L21/52
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