发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve yield while suppressing a cost.SOLUTION: A method for manufacturing a semiconductor device includes the step of forming a via hole 13 containing a first hole 13A and a second hole 13B having an aperture smaller than the first hole from a rear surface side of a semiconductor substrate 1 equipped with a compound semiconductor lamination structure 4 on a front surface side thereof. A via hole formation step includes the steps of: forming the first hole 13A on the semiconductor substrate 1 so that, by dry etching, an etching bottom surface becomes a curved surface, a central portion of the etching bottom surface becomes the compound semiconductor lamination structure 4, and an outer peripheral part of the etching bottom surface becomes the semiconductor substrate 1; and forming the second hole 13B at the compound semiconductor lamination structure 4, by wet etching and with the semiconductor substrate 1 at the outer peripheral part of the etching bottom surface as a mask.
申请公布号 JP2013191763(A) 申请公布日期 2013.09.26
申请号 JP20120057622 申请日期 2012.03.14
申请人 FUJITSU LTD 发明人 OKAMOTO NAOYA
分类号 H01L23/522;H01L21/306;H01L21/3065;H01L21/3205;H01L21/338;H01L21/768;H01L29/778;H01L29/812 主分类号 H01L23/522
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