| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device excellent in inspection performance, which is further robust to an object to be inspected, which is continuously conveyed on a manufacturing line even under environment that there is an unexpected object such as a flaw and a foreign material in an image feature quantity extraction object for detection of a special area, and which does not further require a preparation process.SOLUTION: A defect inspection device inspects a defect of a container having a seal part which closes an opening, and includes: means for conveying the container; means for illuminating the container; means for outputting a timing signal for performing imaging; means for imaging the container; means for detecting a special area; and inspection means. |
