首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
ACID ETCH RESISTANCE FOR CALCAREOUS SUBSTRATES
摘要
<p>A method to provide acid etch resistance to contacting a calcareous substrate with a copolymer prepared from fluorinated methacrylate, short chain branched (meth)acrylate, and (meth)acrylic acid salt and a treated substrate.</p>
申请公布号
WO2013142304(A1)
申请公布日期
2013.09.26
申请号
WO2013US31897
申请日期
2013.03.15
申请人
E. I. DU PONT DE NEMOURS AND COMPANY
发明人
ROSEN, BRAD, M.;SHENOY, SIDDHARTHA, R.;RAGHAVANPILLAI, ANILKUMAR;WYSONG, ERNEST, BYRON;POLLINO, JOEL, M.;HUGHES, JAMES, J.;CROMPTON, JR, JOHN, RUSSELL
分类号
C04B41/48
主分类号
C04B41/48
代理机构
代理人
主权项
地址
您可能感兴趣的专利
PHOTO-GUIDE PLATE, METHOD AND DEVICE FOR MANUFACTURING IT, AND LIQUID CRYSTAL DISPLAY DEVICE
DEVICE AND METHOD FOR FOCUSING
METAL MOLD FOR ASSEMBLED MULTI-FIBER OPTICAL CONNECTOR
PRODUCTION OF POLARIZING FILM
MELTING DECONTAMINATION METHOD FOR RADIOACTIVE CONTAMINATED METAL
WHEEL-TRAIN HOLDING MECHANISM OF ANALOG WATCH
APPARATUS AND METHOD FOR SENSING SNOWFALL
NUCLEAR MAGNETIC RESONANCE APPARATUS
REMAINING CAPACITY DISPLAY DEVICE OF BATTERY FOR ELECTRIC VEHICLE
SPECTRUM ANALYZER
SPECTRUM ANALYZER
METHOD FOR DETERMINING SUGAR CHAIN STRUCTURE
REAGENT TANK
NEUTRON REFLECTION MIRROR
TRANSVERSAL SURGE ESTIMATION METHOD
METHOD FOR ESTIMATING STRENGTH OF WAVE FIELD
GAS CHROMATOGRAPHIC OVEN
METHOD FOR COLLECTING SAMPLE FOR INVESTIGATION OF MATERIAL
APPARATUS FOR INSPECTING IMAGE QUALITY OF LCD PANEL WITH CCD DEFECT CORRECTION FUNCTION
PRESSURE-EQUALIZING PIPE ARRANGEMENT DEVICE