发明名称 MEMORY CELLS, SEMICONDUCTOR DEVICE STRUCTURES, SYSTEMS INCLUDING SUCH CELLS, AND METHODS OF FABRICATION
摘要 Memory cells including cell cores having free regions are disclosed. The free regions exhibit a strain that affects a magnetization orientation within the cell core. A stressor structure may exert a stress upon at least a portion of the cell core to effect the strain state of the free region. Also disclosed are semiconductor device structures and systems including such memory cells as well as methods for forming such memory cells.
申请公布号 US2013250661(A1) 申请公布日期 2013.09.26
申请号 US201213427339 申请日期 2012.03.22
申请人 SANDHU GURTEJ S.;KINNEY WAYNE I.;MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ S.;KINNEY WAYNE I.
分类号 G11C11/16;H01L21/8246;H01L29/82 主分类号 G11C11/16
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