发明名称 TRANSPARENT SUBSTRATE MONITORING APPARATUS AND TRANSPARENT SUBSTRATE MONITORING METHOD
摘要 <p>Provided are a transparent substrate monitoring apparatus and a transparent substrate monitoring method. The transparent substrate monitoring apparatus includes a light emitting unit emitting light; a double slit disposed on a plane defined in a first direction and a second direction intersecting a propagation direction of incident light and includes a first slit and a second slit spaced apart from each other in the first direction to allow the light to pass therethrough; an optical detection unit measuring an intensity profile or position of an interference pattern formed on a screen plane; and a signal processing unit receiving a signal from the optical detection unit to calculate an optical phase difference or an optical path difference.</p>
申请公布号 WO2013141539(A1) 申请公布日期 2013.09.26
申请号 WO2013KR02175 申请日期 2013.03.18
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 KIM, JAE-WAN;KIM, JONG-AHN;JIN, JONG-HAN;KANG, CHU-SHIK;EOM, TAE-BONG
分类号 G01B11/06;G01B9/02 主分类号 G01B11/06
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