发明名称 MEASURING APPARATUS AND MEASURING PROGRAM
摘要 PROBLEM TO BE SOLVED: To accurately perform analysis and indication using a measuring position and a measurement value.SOLUTION: A measuring apparatus includes: an operation unit 11 configured so as to execute measurement value acquisition processing for acquiring a measurement value of a predetermined physical quantity and measuring position acquisition processing for acquiring a measuring position on which the physical quantity is measured; and a processing unit 17 for executing correction processing for correcting the measuring position in accordance with correction operation and storage processing for storing at least one of a correction value specified in the correction operation and the corrected measuring position in a storage unit 14 together with the uncorrected measuring position and the measurement value.
申请公布号 JP2013190321(A) 申请公布日期 2013.09.26
申请号 JP20120056669 申请日期 2012.03.14
申请人 HIOKI EE CORP 发明人 FURUHATA YOSHINORI;TAKAHASHI HIROYUKI;IMAIZUMI KEN
分类号 G01D9/00 主分类号 G01D9/00
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