发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, along with its manufacturing method, containing a nonvolatile memory capable of continuously reading for many years after rewriting many times at a high temperature.SOLUTION: An EEPROM memory includes a matrix of memory cells constituted of row and column. Each of the memory cells includes a memory transistor containing a floating gate and a control gate, and, in series to the same, a selection transistor having a selector gate. The control gates of a plurality of memory transistors are connected to control gate lines respectively, and the selector gate of the selection transistor is connected to a word line 13 respectively. The plurality of selection transistors are connected to each other by a common source line. Since two power sources, or Vppb and 2 V, are added, a potential difference |VGB| between gate and Bulk can be controlled to be 2 V or less.
申请公布号 JP2013191636(A) 申请公布日期 2013.09.26
申请号 JP20120054966 申请日期 2012.03.12
申请人 ASAHI KASEI ELECTRONICS CO LTD 发明人 KUSUHARA MASAYUKI;ISHIKAWA AKIRA
分类号 H01L21/8247;G11C16/04;H01L21/336;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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