发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 In a method of forming MOS transistor, a gate structure is formed on a substrate and a first spacer layer is formed on the substrate conformal to the gate structure. A second spacer layer is formed on the first spacer layer. A second spacer is formed on the first spacer layer corresponding to a sidewall of the gate structure by partially removing the second spacer layer from the first spacer layer. Impurities are implanted in the substrate by an ion implantation process using the gate structure including the first spacer layer and the second spacer as an ion implantation mask to form source/drain extension regions at surface portions of the substrate around the gate structure.
申请公布号 US2013252393(A1) 申请公布日期 2013.09.26
申请号 US201213687104 申请日期 2012.11.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHEON KEON-YONG;KIM DONG-WON;LIM SUNG-MAN;MASUOKA SADAAKI;DONG YAOQI
分类号 H01L29/78 主分类号 H01L29/78
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