发明名称 CALIBRATION DEVICE AND CALIBRATION METHOD
摘要 <p>PURPOSE: A correction jig device is provided to prevent the position of a manipulator from being changed in a distance measuring process by obtaining the distance of the manipulator and the distance of a wafer without contact. CONSTITUTION: A tray (111) is regularly formed on a cassette. The tray forms two walls to be narrower than a wafer (191,193). A distance measuring unit (130) measures a distance from the wafer and a distance from a manipulator (180) which receives the wafer on the tray. The distance measuring unit measures a reference distance from the wafer which is received on the tray. The distance measuring unit generates the position information of the manipulator by using the reference distance and the distance from the manipulator.</p>
申请公布号 KR20130103963(A) 申请公布日期 2013.09.25
申请号 KR20120025033 申请日期 2012.03.12
申请人 CHOI, SUNG HOON 发明人 CHOI, SUNG HOON
分类号 H01L21/677;B25J9/16;H01L21/673 主分类号 H01L21/677
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