| 摘要 |
To provide a weight inspection apparatus capable of calculating the weight of an inspection target object with high precision and a weight inspection system provided therewith, an X-ray inspection apparatus (10) is configured such that a deviation amount calculation unit (45) calculates the degree of the discrepancy of the estimated weight from the actual weight, based on the actual weight of the product (G) which is externally obtained and the estimated weight of the product (G) calculated by each of the function blocks (41 to 44) formed in the control computer (30).
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