发明名称 |
SIGNAL QUALITY MEASURING DEVICE, SPECTRUM MEASURING CIRCUIT, AND PROGRAM |
摘要 |
In the signal quality measurement device of the present invention, a spectrum measurement circuit (101) includes: an N-(where N is an integer equal or greater than 2) phase clock generation circuit (304) for supplying phase-modulated signals in which the phase of a clock signal is shifted by a phase modulation amount each time the settings of the phase modulation amount are switched; a mixer circuit (303) for taking the product of a measured signal that is supplied from a transmitter and the phase-modulated signals that are supplied from the N-phase clock generation circuit (304); an average value output circuit (305) for supplying an average voltage value of the output signal of the mixer circuit (303); a memory (307) for storing the average voltage value supplied from the average value output circuit (305) for each phase modulation amount of the N-phase clock generation circuit (304); and arithmetic unit (308) for using the average voltage value for each phase modulation amount of the N-phase clock generation circuit (304) that is stored in memory (307) to calculate the signal strength of the measured signal. |
申请公布号 |
EP2103948(A4) |
申请公布日期 |
2013.09.25 |
申请号 |
EP20070850815 |
申请日期 |
2007.12.18 |
申请人 |
NEC CORPORATION |
发明人 |
NOSE, KOICHI;MIZUNO, MASAYUKI |
分类号 |
G01R19/00;G01R23/16;H04B17/00 |
主分类号 |
G01R19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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