发明名称 SIGNAL QUALITY MEASURING DEVICE, SPECTRUM MEASURING CIRCUIT, AND PROGRAM
摘要 In the signal quality measurement device of the present invention, a spectrum measurement circuit (101) includes: an N-(where N is an integer equal or greater than 2) phase clock generation circuit (304) for supplying phase-modulated signals in which the phase of a clock signal is shifted by a phase modulation amount each time the settings of the phase modulation amount are switched; a mixer circuit (303) for taking the product of a measured signal that is supplied from a transmitter and the phase-modulated signals that are supplied from the N-phase clock generation circuit (304); an average value output circuit (305) for supplying an average voltage value of the output signal of the mixer circuit (303); a memory (307) for storing the average voltage value supplied from the average value output circuit (305) for each phase modulation amount of the N-phase clock generation circuit (304); and arithmetic unit (308) for using the average voltage value for each phase modulation amount of the N-phase clock generation circuit (304) that is stored in memory (307) to calculate the signal strength of the measured signal.
申请公布号 EP2103948(A4) 申请公布日期 2013.09.25
申请号 EP20070850815 申请日期 2007.12.18
申请人 NEC CORPORATION 发明人 NOSE, KOICHI;MIZUNO, MASAYUKI
分类号 G01R19/00;G01R23/16;H04B17/00 主分类号 G01R19/00
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