| 摘要 |
A measurement apparatus for surface analysis carried out in a gaseous environment such as air comprises a measurement device capable of measuring a contact potential difference B between a probe 502 and a sample surface 516, and a light source for emitting radiation 520 that triggers photoelectric emission 502 from the surface. The apparatus may operate in "dual" photoemission and contact potential difference (CPD) measurement modes. The probe KP may be a Kelvin probe and the light may be ultraviolet. Work function properties of the surface are determined. |
