发明名称 |
Method of performing a chip burn-in scanning with increased efficiency |
摘要 |
Utilize a pattern generator to write a predetermined logic voltage to each memory cell of a memory chip. Read a predetermined logic voltage stored in the memory cell. Compare the predetermined logic voltage stored in the memory cell with the predetermined logic voltage to determine if the memory cell is a good memory cell or not and store a determination result corresponding to the memory cell in a data latch of the memory chip. And determine if the memory chip is a good memory chip or not according to determination results of all memory cells of the memory chip stored in the data latch of the memory chip.
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申请公布号 |
US8543877(B2) |
申请公布日期 |
2013.09.24 |
申请号 |
US201113291041 |
申请日期 |
2011.11.07 |
申请人 |
CHEN WEI-JU;LIU SHI-HUEI;YANG LIEN-SHENG;ETRON TECHNOLOGY, INC. |
发明人 |
CHEN WEI-JU;LIU SHI-HUEI;YANG LIEN-SHENG |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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