发明名称 Resistance variable memory cell structures and methods
摘要 Resistance variable memory cell structures and methods are described herein. One or more resistance variable memory cell structures include a first electrode common to a first and a second resistance variable memory cell, a first vertically oriented resistance variable material having an arcuate top surface in contact with a second electrode and a non-arcuate bottom surface in contact with the first electrode; and a second vertically oriented resistance variable material having an arcuate top surface in contact with a third electrode and a non-arcuate bottom surface in contact with the first electrode.
申请公布号 US8541765(B2) 申请公布日期 2013.09.24
申请号 US20100787018 申请日期 2010.05.25
申请人 MARSH EUGENE P.;QUICK TIMOTHY A.;MICRON TECHNOLOGY, INC. 发明人 MARSH EUGENE P.;QUICK TIMOTHY A.
分类号 H01L47/00 主分类号 H01L47/00
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