发明名称 On-die logic analyzer for semiconductor die
摘要 In one embodiment, the present invention includes a semiconductor die such as a system on a chip (SoC) that includes a logic analyzer with a built-in trace buffer to store information communicated between on-die agents at speed and to provide the information to an off-die agent at a slower speed. Other embodiments are described and claimed.
申请公布号 US8543776(B2) 申请公布日期 2013.09.24
申请号 US201213665198 申请日期 2012.10.31
申请人 INTEL CORPORATION 发明人 ZHONG TINA C.;SANDRI JASON G.;GRIESSER KENNETH P.;BORGER LORI R.
分类号 G06F12/00;G01R31/28;G06F3/00;G06F13/28 主分类号 G06F12/00
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