发明名称 Electrical interconnect forming method
摘要 An electrical interconnect forming method. The electrical interconnect includes a first substrate comprising a first electrically conductive pad, a second substrate comprising a second electrically conductive pad, and an interconnect structure electrically and mechanically connecting the first electrically conductive pad to the second electrically conductive pad. The interconnect structure comprises a non-solder metallic core structure, a first solder structure, and a second solder structure. The first solder structure electrically and mechanically connects a first portion of the non-solder metallic core structure to the first electrically conductive pad. The second solder structure electrically and mechanically connects a second portion of the non-solder metallic core structure to the second electrically conductive pad.
申请公布号 US8541299(B2) 申请公布日期 2013.09.24
申请号 US20100787527 申请日期 2010.05.26
申请人 BUCHWALTER STEPHEN LESLIE;FURMAN BRUCE K.;GRUBER PETER A.;NAH JAE-WOONG;SHIH DA-YUAN;ULTRATECH, INC. 发明人 BUCHWALTER STEPHEN LESLIE;FURMAN BRUCE K.;GRUBER PETER A.;NAH JAE-WOONG;SHIH DA-YUAN
分类号 H01L21/44;H01L21/48 主分类号 H01L21/44
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