发明名称 Enhanced densification of silicon oxide layers
摘要 Densifying a multi-layer substrate includes providing a substrate with a first dielectric layer on a surface of the substrate. The first dielectric layer includes a multiplicity of pores. Water is introduced into the pores of the first dielectric layer to form a water-containing dielectric layer. A second dielectric layer is provided on the surface of the water-containing first dielectric layer. The first and second dielectric layers are annealed at temperature of 600° C. or less. In an example, the multi-layer substrate is a nanoimprint lithography template. The second dielectric layer may have a density and therefore an etch rate similar to that of thermal oxide, yet may still be porous enough to allow more rapid diffusion of helium than a thermal oxide layer.
申请公布号 US8541053(B2) 申请公布日期 2013.09.24
申请号 US201113178057 申请日期 2011.07.07
申请人 MENEZES MARLON;XU FRANK Y.;WAN FEN;MOLECULAR IMPRINTS, INC. 发明人 MENEZES MARLON;XU FRANK Y.;WAN FEN
分类号 B05D3/02;B05D3/04;B32B3/26 主分类号 B05D3/02
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