发明名称 |
Method and apparatus for cross-section processing and observation |
摘要 |
A cross-section processing and observation method includes: forming a first cross section in a sample by etching processing using a focused ion beam; obtaining image information of the first cross section by irradiating the focused ion beam to the first cross section; forming a second cross section by performing etching processing on the first cross section; obtaining image information of the second cross section by irradiating the focused ion beam to an irradiation region including the second cross section; displaying image information of a part of a display region of the irradiation region from the image information of the second cross section; displaying the image information of the first cross section by superimposing it on the image information being displayed; and moving the display region within the irradiation region. Observation images in which display regions are aligned can be obtained while reducing damage to the sample.
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申请公布号 |
US8542275(B2) |
申请公布日期 |
2013.09.24 |
申请号 |
US20100880626 |
申请日期 |
2010.09.13 |
申请人 |
KIYOHARA MASAHIRO;SATO MAKOTO;TAKAHASHI HARUO;TASHIRO JUNICHI;SII NANOTECHNOLOGY INC. |
发明人 |
KIYOHARA MASAHIRO;SATO MAKOTO;TAKAHASHI HARUO;TASHIRO JUNICHI |
分类号 |
H04N7/18 |
主分类号 |
H04N7/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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