发明名称 Patterning Process and Resist Composition Used Therein
摘要 A pattern is formed by applying a first positive resist composition onto a substrate, heat treatment, exposure, heat treatment and development to form a first resist pattern, the first positive resist composition comprising a polymer having copolymerized recurring units having naphthol and recurring units with an alkaline solubility that increases under the action of acid; causing the first resist coating to crosslink and cure by irradiation of high-energy radiation of sub-200 nm wavelength; further applying a second positive resist composition onto the substrate, heat treatment, exposure, heat treatment and development to form a second resist pattern. The double patterning process reduces the pitch between patterns to one half.
申请公布号 KR101310584(B1) 申请公布日期 2013.09.23
申请号 KR20080092161 申请日期 2008.09.19
申请人 发明人
分类号 G03F7/027;G03F7/20 主分类号 G03F7/027
代理机构 代理人
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