发明名称 APPARATUS FOR CHEMICAL-MECHANICAL POLISHING OF WAFER
摘要 PURPOSE: A chemical mechanical polishing apparatus is provided to prevent the damage of a wafer by stopping a wafer polishing process when a scratch is generated. CONSTITUTION: A pad supporting plate is installed on a base supporting unit. A head body part is installed on a polishing head supporting unit. A wafer replacement part (51) loads and unloads a wafer. An image pickup camera (53) and a lighting part (54) are installed on the base support unit. A polishing control part controls a total polishing process.
申请公布号 KR20130102699(A) 申请公布日期 2013.09.23
申请号 KR20120023719 申请日期 2012.03.08
申请人 KIM, OH SU 发明人 KIM, OH SU;PARK, SUN IL
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址