发明名称 |
DUMMY STRUCTURE FOR MULTIPLE GATE DIELECTRIC INTERFACE AND METHODS |
摘要 |
<p>PURPOSE: A dummy structure for a multiple gate dielectric interface and a manufacturing method thereof are provided to remove an interface defect between a high voltage gate dielectric and a low voltage gate dielectric by forming a dummy structure between a high voltage region and a low voltage region of a substrate. CONSTITUTION: A high voltage gate dielectric (22) is formed on a high voltage region (12) of a substrate (10). A low voltage gate dielectric (28) is formed on a low voltage region (14) of the substrate. A dummy structure (32) is formed on the upper surface of the high voltage gate dielectric. The low voltage gate dielectric is thinner than the high voltage gate dielectric. The dummy structure is located on the sidewall of the high voltage gate dielectric.</p> |
申请公布号 |
KR20130103272(A) |
申请公布日期 |
2013.09.23 |
申请号 |
KR20120068510 |
申请日期 |
2012.06.26 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LIU HUEI RU;CHOU CHIEN CHIH;THEI KONG BENG;SHIAU GWO YUH |
分类号 |
H01L27/092;H01L21/8238 |
主分类号 |
H01L27/092 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|