发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To inhibit an occurrence of damages to an element formed on a semiconductor substrate; and enable wiring for high-frequency connection to be formed through the semiconductor substrate in a state where a multilayer interconnection can be formed easier.SOLUTION: A semiconductor device forming method comprises: forming an etching stop layer 102 on a surface of a semiconductor substrate 101; forming wiring 103 on the etching stop layer 102; forming first through wiring 103a which pierces the etching stop layer 102 and is connected to the wiring 103; and subsequently forming a substrate through hole 101b from a rear face side of the semiconductor substrate 101 to reach the etching stop layer 102.
申请公布号 JP2013187225(A) 申请公布日期 2013.09.19
申请号 JP20120048960 申请日期 2012.03.06
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 TSUTSUMI TAKUYA;NISHIMURA KAZUMI;SUGITANI SUEHIRO
分类号 H01L23/522;H01L21/3205;H01L21/768;H01L25/065;H01L25/07;H01L25/18 主分类号 H01L23/522
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