发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To inhibit an occurrence of damages to an element formed on a semiconductor substrate; and enable wiring for high-frequency connection to be formed through the semiconductor substrate in a state where a multilayer interconnection can be formed easier.SOLUTION: A semiconductor device forming method comprises: forming an etching stop layer 102 on a surface of a semiconductor substrate 101; forming wiring 103 on the etching stop layer 102; forming first through wiring 103a which pierces the etching stop layer 102 and is connected to the wiring 103; and subsequently forming a substrate through hole 101b from a rear face side of the semiconductor substrate 101 to reach the etching stop layer 102. |
申请公布号 |
JP2013187225(A) |
申请公布日期 |
2013.09.19 |
申请号 |
JP20120048960 |
申请日期 |
2012.03.06 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
TSUTSUMI TAKUYA;NISHIMURA KAZUMI;SUGITANI SUEHIRO |
分类号 |
H01L23/522;H01L21/3205;H01L21/768;H01L25/065;H01L25/07;H01L25/18 |
主分类号 |
H01L23/522 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|