发明名称 METHODS FOR PROTECTING PATTERNED FEATURES DURING TRENCH ETCH
摘要 A method is provided for forming a monolithic three dimensional memory array. The method includes forming a first memory level above a substrate, and monolithically forming a second memory level above the first memory level. The first memory level is formed by forming first substantially parallel conductors extending in a first direction, forming first pillars above the first conductors, each first pillar including a first conductive layer or layerstack above a vertically oriented diode, the first pillars formed in a single photolithography step, depositing a first dielectric layer above the first pillars, etching first trenches in the first dielectric layer, the first trenches extending in a second direction. After etching, a lowest point in the trenches is above a lowest point of the first conductive layer or layerstack, and the first conductive layer or layerstack does not include a resistivity-switching metal oxide or nitride. Numerous other aspects are provided.
申请公布号 US2013244395(A1) 申请公布日期 2013.09.19
申请号 US201313890321 申请日期 2013.05.09
申请人 SANDISK 3D LLC 发明人 RADIGAN STEVEN J.;RAGHURAM USHA;DUNTON SAMUEL V.;KONEVECKI MICHAEL W.
分类号 H01L29/66 主分类号 H01L29/66
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