发明名称 ENCLOSURE INSPECTION APPARATUS AND ENCLOSURE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a technology for inspecting an enclosure enclosed in an inclusion body in a non-contact and non-opening manner.SOLUTION: An enclosure inspection apparatus 1 inspects an enclosure 93 using a terahertz wave. The enclosure inspection apparatus 1 comprises: an electromagnetic wave irradiation section 13 that irradiates a terahertz wave toward an inclusion body 91 in which an enclosure 93 is enclosed; a transmission wave detection section 23 that detects the terahertz wave transmitted through or reflected on a part of a first information code 95 about the enclosure 93 recorded on the inclusion body 93 with ink reflecting or absorbing the terahertz wave; and a barcode recognition section 72 that reads a barcode 95B included in the first information code 95 on the basis of the result of detection by the transmission wave detection section 23.
申请公布号 JP2013186104(A) 申请公布日期 2013.09.19
申请号 JP20120054142 申请日期 2012.03.12
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 NAKANISHI HIDETOSHI
分类号 G01N22/02;G01N22/00 主分类号 G01N22/02
代理机构 代理人
主权项
地址